High temperature testing of automotive chips
In terms of reliability testing for automotive grade chips, Shanghai Putaike High and Low Temperature Testing Machine has unique advantages that are different from traditional high and low temperature impact testing chambers: fast temperature change rate, fast temperature rise/fall of 18 ℃ per second, real-time monitoring of the actual temperature of the tested component, and the temperature of the impact airflow can be adjusted at any time. It can perform high and low temperature impact on a single IC among many components on the PCB circuit board separately, without affecting other peripheral components