了解最新国产一区二区影院_成人综合亚洲区自拍_亚洲香蕉伊在人在线观看9_国产欧美综合另类第1页_欧美男男大粗吊1069_歐美一區二區三區影院_无码高潮少妇毛多水多水免费_亚洲精品视频天堂_免费10款夜里禁用b站app_国产永久成人免费播放视频

It mainly consists of heating circulation system, cooling system, control system, box, etc. The heating cycle system consists of a circulation pump, an electric heater, an expansion vessel, an exhaust valve, a one-way valve, a thermal resistor, and a circulation pipeline. The cooling system consists of oil-water heat exchangers, oil-oil heat exchangers (some equipment), cooling water solenoid valves, high-temperature solenoid valves, etc. The control system adopts PID control technology, high-definition touch screen display, and is equipped with multiple protection functions to ensure the safe operation of the equipment. By heating and cooling the unit itself, the heat carrying fluid is transported to the outside world to meet the requirements of the process conditions.

Provide accurate and fast ambient temperature for chips, modules, integrated circuit boards, electronic components, etc. Replacing liquid nitrogen to provide rapid cooling for local heat sources. Provide a cold source for testing the electrical performance, reliability, aging, and other aspects of the product

Putek's PTHC series is suitable for process industry and process engineering, and is applied in dynamic constant temperature control of cold and heat sources such as jacket reactors, microchannel reactors, reaction devices, and combination chemistry, as well as in low-temperature distillation, distillation, extraction and other equipment in the pharmaceutical industry.

High and low temperature impact heat flow meter, also known as: high and low temperature impact airflow meter, cold and hot impact testing machine, rapid cooling instrument, heat flow meter, heat flow hood Adopting a mobile design, it provides a fast and accurate temperature environment for chip temperature testing by outputting fast, clean, and dry cold and hot circulation impact airflow. It is suitable for simulating the application of chips in various temperature testing and adjustment, and is widely used in high and low temperature cycling tests of integrated circuit IC cards, electronic chips, flash memory, power devices, fiber optic transceivers, or electronic circuits.